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Inspec 0-25mm Parallax Free Micrometers Carbide measuring faces Graduation .001mm 112-01-110 Height Gauge Cycle testing

SKU 35036088728
4.6
USD63.00 USD99.00

Pay in 4 interest-free payments of $15.75 Learn more

Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Aug 18 - Aug 23

Description

Cycle testing

for SJ-410

Rapid positioning and micro screw fine adjustment

reversible aluminium housing allows for hand held use or test stand mounting for more sophisticated testing requirements

0mm 30-805-4323

Inspec 0-25mm Parallax Free Micrometers Carbide measuring faces Graduation .001mm 112-01-110 Height Gauge Cycle testingInspec Parallax free Micrometers No Parallax error vernier scale for high accuracy measurement Carbide measuring faces Graduation . 001mm in metric and . 0001" in imperial Inspec 112 01 110, 0 25mm Parallax free Micrometers Carbide measuring faces Graduation . 001mm

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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